~/talk

Metal-In Test-Driven Development: A Dual-Target TDD approach

Talkat NDC TechTown 2024 · 2024-09-09..09-12· [testing, embedded-and-hardware]
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slides:none on file

Metal-In TDD shows a Dual-Target workflow that builds a portable BatteryMonitor in C for an 8-bit MCU by driving behavior with unit tests, test doubles and gradual refactoring. Uses Ceedling and CMock with GCC and a Microchip simulator to run tests on target (27s) and host (≈10s), triangulates thresholds (0, 25, 49, 50%), extracts a PAL to hide GPIO bits, and verifies the module runs green on both simulator and real target.

AI-written summary · about

  1. 0:00Introduction
  2. 6:25Motivation for Metal-In TDD
  3. 13:32Four-level battery monitor demo
  4. 17:46Development environment setup
  5. 22:00First test and hardware discovery
  6. 25:37First test pass and validation
  7. 27:24Refactoring code structure
  8. 33:05Test doubles for dependencies
  9. 38:01Battery percentage logic
  10. 41:38Host environment tests
  11. 45:29Behavior expansion with triangulation
  12. 49:49Decoupling hardware specifics
  13. 57:45Final refactoring and inversion
  14. 59:33Conclusion
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